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Force Microscopy Lab | Meyer Group

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  • RT AFM/STM
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Facilities and instruments

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LT Tuning Fork AFM/STM

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RT Friction Force AFM

sputter

Plasma and sputter deposition

JT STM

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Pendulum UHV-AFM

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Electrospray Ionization

thin_film

Thin film characterization

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RT AFM/STM

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Large Scan Range UHV AFM

ESCA

Photoelectron Spectroscopy

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