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New Thematic Issue for BJNano
We are pleased to announce that for this year's nc-AFM 2024 in Montreal, we are again offering the opportunity to submit your scientific results to a peer-reviewed thematic issue titled "At the cutting edge of atomic force microscopy" with the Beilstein Journal of Nanotechnology (BJNANO). This Diamond Open Access journal publishes high-quality original articles covering all aspects of nanoscience and nanotechnology, and has been supporting our community for many years. Key benefits include:
- No author or reader fees (Diamond Open Access).
- Immediate online publication upon acceptance.
- Authors retain full copyright.
- High visibility for your work.
- Archived and indexed in all major repositories and databases.
- No restrictions on number of figures, references or pages.
- You are welcome to submit a review, perspective, full research article or letter.
Submit your manuscript for the nc-AFM 2024 Thematic Issue by October 31, 2024. Please indicate in your cover letter that your submission is for this thematic issue.
For more details, please visit the /Beilstein Journal of Nanotechnology/ website.
Plan ahead and take advantage of this unique opportunity to showcase your research. We look forward to receiving your submissions.
Omur, Peter & Thilo for BJNANO
For questions please contact us