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NCCR SPIN Master’s Fellowship
The project aim is to characterize the semiconducting Si, Ge and Ge/Si core-shell nanowires for future implementation into devices. The measurements are performed by means of Kelvin Probe Force Microscopy (KPFM) and oscillating contact Atomic Force Microscopy (AFM) operating in ultra high vacuum. KPFM can determine the amount of charge impurities, which are serious source of q-bit decoherence, whereas oscillating contact AFM helps to determine the structure quality of the nanowires.
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